RELIABILITY PHYSICS TUTORIALS
Two days, (Two registration choices & Two sets of
Tutorial Notes)
Sunday and Monday, 8:00 a.m. 5:00 p.m., April 7-8
Tutorial Tracks :
-
Reliability Fundamentals, Sunday April 7
and/or
-
Topics in Advanced Reliability , Monday, April 8
Chair: Tom M. Moore, Omniprobe
Vice Chair: Chris L. Henderson, Sandia National Labs
Vice Chair: Cheryl Hartfield, Texas Instruments
Sunday, April 7
TUTORIAL TRACK: Reliability Fundamentals
Room: Landmark A
| 111. |
Introduction to Semiconductor Reliability |
|
Tim Rost & Vijay Reddy, Texas Instruments
abstract |
|
(8:00 11:30) |
| 112. |
Characterization, Physical Modeling and Assessment of Gate Oxide
Reliability |
|
Eric Vogel, NIST
abstract |
|
(1:30 3:00) |
| 113. |
ESD Basics |
|
Charvaka Duvvury, Texas Instruments
abstract |
|
(3:30 5:00) |
Room: Landmark B
121. Radiation Induced Soft Errors in
Silicon Components & Computer Systems
(8:00 5:00) ...continuing into a Sunday evening workshop on this
topic
organized under the direction of Robert Baumann, Texas
Instruments & Jose Maiz, Intel
| Intro |
Workshop Objectives & Agenda. Jose Maiz,
Intel |
8:00 - 8:15 |
| 121.01 |
Soft Errors in Commercial Semiconductor
Technology:Overview and Scaling TrendsRobert Baumann, Texas Instruments
abstract |
8:15 - 9:00 |
| 121.02 |
Memory Devices Share of System SERGuenter
Schindlbeck, Infineon Technologies
abstract |
9:00 - 9:30 |
| 121.03 |
Accelerated Testing for Cosmic Ray Soft-Error Rates in Computer Systems—Richard Adkisson, HP
abstract | 10:00 - 10:30 |
| 121.04 |
Impact of Technology Scaling and Logic Design Style on the Core
Logic SER of Microprocessors—Norbert Seifert, Compact Computers
abstract |
10:30 - 11:00 |
| 121.05 |
Low Activity Alpha Particle Detection—Mike Tucker,Alpha Sciences Inc
abstract |
11:00 - 11:20 |
| 121.06 |
New Method for Determining Ultra Low Alpha Emission Levels—Rhys Thomas, Inovatia Labs
abstract
| 11:20 - 11:40 |
| 121.07 |
CMOS Soft Errors and Server Design—Douglas Bossen, IBM
abstract
| 11:40 - 12:10 |
| 121.08 |
A Kind and Gentler Guide to Soft Error Rate—Hang Nguyen, Intel
abstract
| 1:30 - 2:00 |
| 121.09 |
Memory SER Concerns For Future Server Applications—Charles Slayman, Sun Microsystems
abstract
| 2:00 - 2:30 |
| 121.10 |
Comparison of Soft Errors in Protected and Unprotected Processors—Peter Rohr, iROC Technologies
abstract
| 2:30 - 3:00 |
| 121.11 |
Mitigation Methods for Soft-Errors and Related Phenomena in Spacecraft—Allan Johnston JPL
abstract
| 3:30 - 4:00 |
| 121.12 |
Mitigation of Single-Event effects in Mission-Critical Systems—Paul Dodd & Fred Sexton, Sandia National Labs
abstract
| 4:00 - 4:30 |
|
Summary—Jose Maiz, Intel
| 4:30 - 4:45 |
7:00 p.m. – 11:00 p.m. SER PANEL DISCUSSION—Moderator Jose Maiz
Room: Landmark C
| 131. |
Errors and Reliability |
|
Kristof Croes, XPEQT, and Luc Tielemans
abstract |
|
(8:00 9:30) |
| 132. |
Trends in Failure Analysis |
|
Larry Wagner, Texas Instruments |
|
(10:00 11:30) |
| 133. |
New Phenomena in the Device Reliability Physics of Advanced Submicron
CMOS Technologies (NBTI) |
|
Giuseppe La Rosa, IBM
abstract |
|
(1:30 5:00) |
Room: Landmark D
| 141. |
The basics of Electromigration with a view towards Cu dual-damascene
reliability |
|
Ennis Ogawa, Texas Instruments
abstract |
|
(8:00 9:30) |
| 142. |
Introduction to Predictive Wafer Level Reliability |
|
Eric Snyder, Sandia Technologies
abstract |
|
(10:00 11:30) |
| 143. |
Defect Reliability Statistics with Redundancy |
|
Glenn Shirley, Intel
abstract |
|
(1:30 3:00) |
Monday April 8
TUTORIAL TRACK: Topics in Advanced Reliability
Room: Landmark A
| 211. |
Reliability Issues for Advanced Silicon Technologies |
|
Anthony S. Oates, Agere
abstract |
|
(8:00 11:30) |
| 212. |
Microstructure, Processing and Reliability of Cu-Based Interconnect
Structures |
|
John Sanchez, AMD |
|
(1:30 3:00) |
| 213. |
ESD Protection and Failure mechanisms in RF Technology |
|
Steven Voldman, IBM
abstract |
|
(3:30 5:00) |
Room: Landmark B
| 221. |
Gate Oxide Reliability |
|
Paul Nicolian, Texas Instruments
abstract |
|
(8:00 9:30) |
| 222. |
Antenna Charging (PID) |
|
Srikanth Krishnan and Anand Krishnan, Texas Instruments |
|
(10:00 11:30) |
| 223. |
Atomic Scale Defects Involved in MOS Reliability Problems |
|
Pat Lenahan, Penn State
abstract |
|
(1:30 3:00) |
| 224. |
Trap Generation Phenomena in Thin Dielectrics under Electrical Stress |
|
Gennadi Bersuker, SEMATECH
abstract |
|
(3:30 5:00) |
Room: Landmark C
| 231. |
Raman Spectroscopy |
|
Ingrid DeWolf, IMEC
abstract |
|
(8:00 9:30) |
| 232. |
Next Generation Imaging |
|
Gay Samuelson, Intel
abstract |
|
(10:00 11:30) |
| 233. |
Designing MEMS/MOEMS for Reliability |
|
Susanne Arney et al., Lucent
abstract |
|
(1:30 5:00) |
Room: Landmark D
| 241. |
Silicon Analog/Mixed Signal Technology Reliability |
|
Jae-Sung Rieh & Fernando Guarin, IBM
abstract |
|
(8:00 9:30) |
| 242. |
Ferroelectric Material and Device Reliability |
|
Domokos Hadnagy, Ramtron
abstract |
|
(10:00 11:30) |
| 243. |
Determination of GaAs MMIC Reliability |
|
Ken Decker, Triquint Semiconductor
abstract |
|
(1:30 3:00) |
| 244. |
HBT |
|
Tim Henderson, Triquint Semiconductor
abstract |
|
(3:30 5:00) |