Silicon Analog/Mixed Signal Technology Reliability

Jae-Sung Rieh and Fernando Guarin
SiGe Technology Development
IBM Communications R & D Center, East Fishkill

A review on the reliability of analog/mixed signal technologies is provided with SiGe BiCMOS as an example. The forward and reverse mode reliability of SiGe HBTs are discussed as well as CMOS reliability focused on analog applications. Reliability issues for passive components such as capacitors, resistors, and inductors are also reviewed.

Jae-Sung Rieh

Jae-Sung Rieh received the B.S. and M.S. degrees in electronics engineering from Seoul National University, Seoul, Korea, in 1991 and 1995, respectively, and the Ph.D. degree in electrical engineering from the University of Michigan, Ann Arbor, in 1999. Since 1999, he has been with IBM Communications R & D Center, where he is involved in the design, characterization, and reliability assessment of ultra high speed SiGe HBTs for analog and mixed-signal applications and the analysis and modeling of the thermal and avalanche behavior of the SiGe HBTs.

Fernando Guarin

Fernando Guarin earned a BSEE from the "Pontificia Universidad Javeriana", in Bogota, Colombia, an M.S.E.E. degree from the University of Arizona, and a Ph.D in Electrical Engineering form Columbia University. From 1980 until 1988 he was a member of the Military and Aerospace Operations division of National Semiconductor Corporation where he held positions both in engineering and management. In 1988 he joined the IBM microelectronics division where he is currently a Senior Engineer/Scientist at the IBM Microelectronics Semiconductor Research Development Center SRDC in East Fishkill N.Y