| X. AYMERICH | University of Barcelona (E) |
| L. J. BALK | University of Wuppertal (D) |
| J. BISSCHOP | Philips (NL) |
| M. CIAPPA | ETH Zurich (CH) |
| Y. DANTO | University of Bordeaux (F) |
| F. FANTINI | University of Modena (l) |
| J. P. FORTEA | CNES (F) |
| W. GERLING | Infineon (D) |
| C. LINDSAY | Marconi (UK) |
| L. LONZI | ST Microelectronics (l) |
| G. GROESENEKEN | IMEC (B) |
| J. MOELTOFT | Technical University of Denmark (DK) |
| A. J. MOUTHAAN | University of Twente (NL) |
| N. STOJADINOVIC | University of Nis (Y) |
| R. THOMAS | Tech Experts Network (USA) |
| W. WONDRAK | Daimler Chrysler (D) |
