| The 8th International Symposium on the Physical
and Failure Analysis of Integrated Circuits (IPFA) 2001 is organised by
the IEEE Reliability/CPMT/ED Singapore Chapter in co-operation with the
Centre
for Integrated Circuit Failure Analysis and Reliability (CICFAR) of
the National University of Singapore (NUS) and the Institute
of Microelectronics (IME).
The Symposium is technically co-sponsored by the IEEE
Electron Device Society.
The Symposium will be devoted to the fundamental understanding
of the physical mechanisms of device failures and issues pertaining to
device reliability, especially those related to advanced process technologies.
The symposium will be held in the Westin Stamford &
Westin Plaza Singapore, from 9 to 13 July 2001. |
