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The 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2002 is organised by the IEEE Reliability/- CPMT/ED Singapore Chapter in co-operation with the Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR) of the National University of Singapore (NUS).
The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society
The Symposium will be devoted to the fundamental understanding of the physical mechanisms of device failures and issues pertaining to device reliability, especially those related to advanced process technologies.
The symposium will be held in the Raffles City Convention Center, Singapore, from 8 to 12 July 2002
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