The 5th THERMINIC Workshop

 

The 5th Therminic Workshop met in Rome from October 3 to 6, 1999. The workshop was organized by TIMA Laboratory and the TU Budapest, sponsored by the IEEE Computer Society, Test Technology Technical Council, the TIMA Laboratory in cooperation with the DETERMIN project supported by EC/ESPRIT, and with the European Test Technology Technical Committee.

This workshop gathered more than 80 submissions from around the world, out of which the program committee selected 42 contributions for oral presentation and 28 ones for poster presentation. This time, first in the history of the workshops, tutorials were organised.

 

Program overview
SUNDAY 3 OCTOBER
9:30 Tutorial A   /   Tutorial B
12:30 Lunch
14:00 Tutorial A   /   Tutorial B
MONDAY 4 OCTOBER
8:00 Registration
9:30 Welcome address

Opening address

9:40 Invited talk

THERMAL PACKAGING FOR THE 21ST CENTURY: CHALLENGES AND OPTIONS
10:20 Session 1 ADVANCED MEASUREMENT TECHNIQUES
12:00 Lunch
13:30 Session 2 TEMPERATURE MEASUREMENT AND MONITORING
14:30 Coffee
14:50 Embedded Tutorial A SURVEY ON COUPLED TRANSPORT PROCESSES IN THIN LIQUID FILMS FOR MICROCHANNEL HEAT TRANSFER APPLICATION
15:10 Session 3 ADVANCED COOLING TECHNOLOGIES
17:15 Poster session 1  
19:00 Reception
TUESDAY 5 OCTOBER
8:30 Invited talk NEEDS AND TRENDS IN INDUSTRIAL THERMAL MANAGEMENT OF ELECTRONICS
9:10 Session 4

ELECTRO-THERMAL SIMULATION
11:10 Coffee
11:30 Session 5 EXPERIMENTAL VALIDATION OF NUMERICAL ANALYSIS
13:15 Lunch
14:30 Vendors Session
16:00 Session 6 STUDIES ON THERMAL MATERIAL PARAMETERS
17:20 Coffee
17:40 Poster session 2  
19:00 Diner
20:30 Panel WHAT ARE THE EXPECTATIONS OF THE ELECTRONICS INDUSTRY FROM THE THERMAL ACADEMIC COMMUNITY ?
WEDNESDAY 6 OCTOBER
9:00 Invited talk THERMAL STRESS IN MICROELECTRONICS PACKAGING: PROBABILISTIC APPROACH
9:40 Coffee
10:00 Embedded Tutorial THERMAL CHARACTERISATION BY COMPACT MODELS: WHERE ARE WE ?
10:20 Session 7 THERMAL AND THERMOMECHANICAL CHARACTERISATION
12:00 Lunch
13:00 Session 8 MEMS
14:20 Coffee
14:40 Session 9 THERMAL ANALYSIS TECHNIQUES
15:40 Closing remarks

 

Detailed program
MONDAY 4 OCTOBER
8:00-9:30 Registration
9:30-9:40 Welcome address: B. Courtois, General Chair, TIMA Laboratory, Grenoble, France

9:40-10:20 Invited talk: A. Bar-Cohen, University of Minnesota, USA

Chair: V. Székely, TU of Budapest, Hungary

THERMAL PACKAGING FOR THE 21ST CENTURY: CHALLENGES AND OPTIONS
10:20-12:00 Session 1

Chair: O. Slattery, NMRC, Ireland

ADVANCED MEASUREMENT TECHNIQUES
10:20 V. Székely1, S. Ress1, A. Poppe1, S. Török1, D. Magyari1, Zs. Benedek1, B. Courtois2, M. Rencz3
1TU of Budapest, Hungary
2TIMA, Grenoble, France
3MicRed, Budapest, Hungary
Transient thermal measurements for dynamic package modeling: new approaches
10:40 N. Trannoy, S. Gomès, P. Grossel
U. of Reims, France
Thermal characterization of measurement by STM and STHM
11:00 M. Rohde
Forschungszentrum Karlsruhe, Germany
Nondestructive testing and determination of thermal parameters in thin films and microcomponents
11:20 R. Grimes, M. Davies
U. of Limerick, Ireland
PIV measurements of cooling fan aerodynamics
11:40 N. Mathis
Mathis Inst., Fredericton, Canada
New instrument for thermal management design
12:00-13:30 Lunch
13:30-14:30 Session 2

Chair: D. De Cogan, U. of East Anglia, United Kingdom

TEMPERATURE MEASUREMENT AND MONITORING
13:30 M. Janicki, A. Napieralski
TU of Lodz, Poland
New approach to electronic circuit temperature monitoring
13:50 R.A. Bianchi1, J.M. Karam1, B. Courtois1, R. Nadal2, F. Pressecq3, S. Sifflet4
1TIMA, Grenoble, France
2UPC Barcelona, Spain
3CNES, Toulouse, France
4TRS31, Auterive, France
CMOS compatible temperature sensor with digital output for wide temperature range applications
14:10 H. Bellaj, J.M. Dorkel, P. Tounsi, Ph. Leturcq
LAAS, Toulouse, France
Validity and limits of the junction temperature concept for integrated power devices
14:30-14:50 Coffee
14:50-15:10 Embedded Tutorial
C.P. Tso, S.P. Mahulikar
, Nanyang TU, Singapore

Chair: G. De Mey, U. Gent, Belgium

A SURVEY ON COUPLED TRANSPORT PROCESSES IN THIN LIQUID FILMS FOR MICROCHANNEL HEAT TRANSFER APPLICATION
15:10-17:10 Session 3

Chair: G. De Mey, U. Gent, Belgium

ADVANCED COOLING TECHNOLOGIES
15:10 C. Perret1,2, J. Boussey2, Ch. Schaeffer1, M. Coyaut1
1LEG, Grenoble, France
2LPCS, Grenoble, France
Integration of cooling devices in silicon technology
15:30 G.B. Russell, W.Z. Black, J.G. Hartley, A. Glezer
Georgia Inst. of Techno, Atlanta, USA
Microjet cooling of single level integrated modules
15:50 P. Dziurdzia, A. Kos
U. of Mining and Metallurgy, Krakow, Poland
Electrothermal macromodel of active heat sink for cooling process simulation
16:10 G.I. Sultan
Mansoura U., Egypt
Enhancing forced convection heat transfer from multiple protruding heat sources simulating electronic components in a horizontal channel by passive cooling
16:30 D.G. Wang
NCR, San Diego, USA
Expanding conventional system level forced air-cooling envelope
16:50 C.H. Amon
Carnegie Mellon U., Pittsburgh, USA
Metrics for transient cooling of portable electronics
17:15-19:00 Poster session 1

Chair: M. Rencz, Techn. Univ. of Budapest, Hungary

 
  N. Pesare, A. Giorgio, B.M. Bobbo, A.G. Perri
Politecnico di Bari, Italy
A new electrothermal simulator of GaAs MESFETs for optimal layout design of MMICs
  K.O. Petrojanc1, I.A. Kharitonov1, P. Maltcev1, N.I. Rjabov1, L.N. Kravtchenko2, A.N. Sapelnikov2
1MUEM, Moscow, Russia
2Science and Research Inst. of Molecular Electr., Moscow, Russia
High-speed digital GaAs ICs electro-thermal simulation with PSPICE
  T. Franke
Siemens, München, Germany
Thermal modelling of multichip assemblies
  M.Rencz, V. Székely, Zs. Kohari, S. Ress, A. Pàhi, A. Poppe
TU of Budapest, Hungary
Thermal evaluation of the SIP9 package
  S. Ramminger1, J.G. Bauer1, T. Scherg1, H.J. Schulze1, K. Mosig2, G. Wachutka3
1Siemens, München, Germany
2Infineon, Villach, Austria
3München U. of Techno., Germany
Temperature behavior of power devices with copper metallisation using thermal simulation
  R. Schacht1, M. Kasper2, H. Reichl1
1TU of Berlin, Germany
2TU Hamburg-Harburg, Germany
Macro modelling for transient simulation of coupled electro-thermal problems for an IGBT module
  E.W. Kreutz1, N. Pirch1, T. Ebert2,3, R. Wester2, B. Ollier2,3, P. Loosen2, R. Poprawe1,2
1LLRWTH, Aachen, Germany
2Fraunhofer-Inst. für Lasertechnik, Aachen, Germany
3PROLAS, Aachen, Germany
Simulation of micro-channel heat sinks for optoelectronic microsystems
  S. Galliou, M. Mourey
ENSMM, Besançon, France
Simulation of thermal regulated ultra stable quartz oscillator
  A.G. Madera, M.Sh. Sourgouladze
Russian Acad. of Science, Moscow, Russia
Stochastical temperature fields in ICs and electron modules and method for their calculation
  A. Poppe, Gy. Csaba, K. Tarnay, V. Székely
TU of Budapest, Hungary
Considering electro-thermal interations in sub-micron n-MOS transistor on microscopi scale within a 3D particle dynamics based monte carlo simulator
  F.H. Fernandez Morales, J. Samitier
U. of Barcelona, Spain
Thermal behaviour of a bioparticle microhandler: a transient approach
  D. Fedasyuk, E. Levus, M. Mykhalchuk, D. Petrov
State U. Lvivska Polytech, The Ukraine
Modelling and analysis of methods of providing thermal performance of flip-chip structure
  E. Chen Xiansong
Hewlett-Packard, Singapore
Thermal performance study for a MCMS infrared transceiver by FEM
  J. Diefenbach1, F. Hiller2, R. Vahrmann2
1DaimlerChrysler, Frankfurt, Germany
2TEMIC, Heilbronn, Germany
THERESCA: a tool to calculate the thermal resistance of an electronic package
19:00 Reception
TUESDAY 5 OCTOBER
8:30-9:10 Invited talk: J. Rantala, Nokia, Helsinki, Finland

Chair: C. Lasance, Philips, Eindhoven, The Netherlands

NEEDS AND TRENDS IN INDUSTRIAL THERMAL MANAGEMENT OF ELECTRONICS
9:10-11:10 Session 4

Chair: J.M. Dorkel, LAAS, Toulouse, France

ELECTRO-THERMAL SIMULATION
9:10 M.N. Sabry1, H. Haddara2, K. Abdel-Salam3, M. Awad1, A. Nasser3
1Mansoura U., Egypt
2Mentor Graphics, Egypt
3Tenth of Ramadan Higher Tech. Inst., Egypt
Investigation of self heating in SIMOX transistors operated at high temperatures using a boundary value problem formulation
9:30 P. Tounsi, K. Bellil, J.M. Dorkel
LAAS-INSAT, Toulouse, France
Transient electrothermal computation: large power IGBT and MOS modules in on-state operating conditions
9:50 C. Harlander1, R. Sabelka1, R. Minixhofer2, S. Selberherr1
1TU Vienna, Austria
2Austria Mikro Systeme Intl, Unterpremstätten, Austria
Three-dimensional transient electro-thermal simulation
10:10 D. D'Amore, P. Maffezzoni
Politecnico di Milano, Italy
Electro-thermal analysis of paralleled bipolar devices
10:30 M. Jakovljevic, P. Fotiu, Z. Mrcarica, H. Detter
TU Wien, Austria
A method for simultaneous 3D electro-thermal simulation of microsystems
10:50 G. Breglio1, F. Frisiana2, A. Magri2, P. Spirito1
1U. of Napoli, Italy
2STMicroelectronics, Catania, Italy
Thermal mapping of new cellular power MOS affected by electro-thermal instability
11:10-11:30 Coffee
11:30-13:10 Session 5

Chair: K. Azar, Lucent Technologies, Andover, USA

EXPERIMENTAL VALIDATION OF NUMERICAL ANALYSIS
11:30 M.N. Sabry
Mansoura U., Egypt
Scale effects on fluid flow and heat transfer in micro-channels
11:50 D. Newport1, M. Davies1, T. Dalton1, M. Whelan2
1U. of Limerick, Ireland
2Joint Research Centre, Ispra, Italy
An optical and numerical investigation into the temperature and velocity fields about an enclosed PCB with an array of simulated 2D components in free convection
12:10 J. Lohan, P. Tiilikka, C.M. Fagar, J. Rantala
Nokia, Helsinki, Finland
Effect of PCB thermal conductivity on the operating temperature of an SO-8 package in a natural convection environment: experimental measurement versus numerical prediction
12:30 P. Rodgers1, J. Lohan2, V. Eveloy2
1U. of Limerick, Ireland
2Nokia, Helsinki, Finland
Impact of both convective environment and PCB conductivity on the distribution of heat transfer from three electronic component package types-operating on single-and multi-component printed circuit boards
12:50 D. Agonafer1, R. Schmidt1, A. Free2
1IBM, Poughkeepsie, USA
2Maya Heat Transfer Technologies, USA
A coupled conjugate model of the internal and external resistance of a TCM
13:15-14:15 Lunch
14:30-16:00 Vendors' Session
16:00-17:20 Session 6

Chair: J.B. Saulnier, ENSMA, Poitiers, France

STUDIES ON THERMAL MATERIAL PARAMETERS
16:00 M. Malinski, L. Bychto
TU of Koszalin, Poland
Photoacoustic studies of the absorption coefficient of CdTe
16:20 M. Malinski, L. Bychto
TU of Koszalin, Poland
The influence of the quality of the semiconductor surface on the photoacoustic signal characteristics on the example of CdTe studies
16:40 A. Drushinin, Y. Pankov, I. Maryamova, Y. Khoverko
Lviv Polytech. State U., The Ukraine
The Piezo-seebeck effect in p-type silicon
17:00 J. Zakrzewski1, F. Firszt1, S. Legowski1, H. Meczynska1, B. Sekulska1, J. Szatkowski1, W. Paszkowicz2
1Inst. of Physics, Torun, Poland
2Polish Academy of Sciences, Warsaw, Poland
Photoacoustic investigations of beryllium containing wide gap II-VI mixed crystals
17:20-17:40 Coffee
17:40-18:40 Poster session 2

Chair: M. Rencz, Techn. Univ. of Budapest, Hungary

 
  V.Székely1, A. Nagy1, S. Török1, E. Nikodemusz-Székely2, M.Rencz3
1TU of Budapest, Hungary
2Res. Inst. for Comp. Automation, Budapest, Hungary
3MicRed, Budapest, Hungary
Electrically controlled thermal resistance: an experiment
  G.C. Albright1, J.A. Stump1, J.D. McDonald1, H. Kaplan2
1Quantum Focus Instr., Shelton, USA
2Honeyhill Techn. Comp., Norwalk
"True" temperature measurements on microscopic semiconductor targets
  R. Houlihan, G. Kelly, C. Lyden
NMRC, Cork, Ireland
Development of behavioural models of resonant sensor elements subject to residual stress
  V. Golembo, V. Kotlarov, S. Kharytonov
State U. "Lviv Polytechnic", The Ukraine
The piezoquartz temperature sensor's interfac modules
  N.F. Strarodub, V.M. Starodub
NASU, Kyiv, The Ukraine
Microthermal enzymatic sensor for the express monitoring of the cyanide content in water
  Yu.P. Dotsenko, T.Ya. Gorbach, L.O. Matveeva, P.S. Smertenko, S.V. Svechnikov, E.F. Venger
NASU, Kyiv, The Ukraine
Dimensionless sensitivity as a base for modeling of thermometric characteristics of thermodiode sensors
  M. Davies, E. Kehoe, J. Punch
U. of Limerick, Ireland
Thermal gradients and electronic component reliability
  N.R. Kamat
Chartered Semiconductor, Singapore
Investigating reliability on the 5 metal single poly 0.25um CMOS process
  S. Volz1, J.B. Saulnier1, G. Chen2, P. Beauchamp3
1LET, Poitiers, France
2UCLA, Los Angeles, USA
3U. of Poitiers, Futuroscope, France
Computation thermal conductivity of superlattices by molecular dynamics technique
  R.A. Bianchi, J.M. Karam, B. Courtois
TIMA, Grenoble, France
Pressure and temperature integrated measurement system for high temperature oil well applications based on ALC crystal oscillators
  Ch. S. Roumenin, A. Ivanov, P. Nikolova
Inst. of Control & System Research, Sofia, Bulgaria
Thermogradiometer sensor based on differential microdiode
  M. Strasser1,2, F. Flötz1, R. Aigner1, G. Wachutka2
1Infineon, München, Germany
2München U. of Techno., Germany
Device performance of CMOS low power thermoelectric generators
19:00-20:30 Diner
20:30 Panel

Moderator: D. Agonafer, IBM, Poughkeepsie, USA

Panelists:
J. Parry, Flomerics, Hampton Court, United Kingdom
J. Rantala, Nokia, Helsinki, Finland
K. Azar, Lucent Technologies, Andover, USA
H. Pape, Infeneon, München, Germany
J. Janssen, Philips, Nijmegen, The Netherlands
C. Villa, STMicroelectronics, Agrate Brianza, Italy
T. Tarter, AMD, Sunnyvale, USA

WHAT ARE THE EXPECTATIONS OF THE ELECTRONICS INDUSTRY FROM THE THERMAL ACADEMIC COMMUNITY ?
WEDNESDAY 6 OCTOBER
9:00-9:40 Invited talk: E. Suhir, Lucent Technologies, Murray Hill, USA

Chair: B. Courtois, TIMA, Grenoble, France

THERMAL STRESS IN MICROELECTRONICS PACKAGING: PROBABILISTIC APPROACH
9:40-10:00 Coffee
10:00-10:20 Embedded Tutorial
C. Lasance
, Philips, Eindhoven, The Netherlands

Chair: T. Tarter, AMD, Sunnyvale, USA

THERMAL CHARACTERISATION BY COMPACT MODELS: WHERE ARE WE ?
10:20-12:00 Session 7

Chair: T. Tarter, AMD, Sunnyvale, USA

THERMAL AND THERMOMECHANICAL CHARACTERISATION
10:20 J.M. Bosc1, P. Dupuy1, J. Gil1, J.M. Dorkel2, G. Sarrabayrouse2
1Motorola, Toulouse, France
2LAAS, Toulouse, France
Thermal characterization: a key element for accelerating stress testing
10:40 D. Giusti, G. Verzellesi, G.U. Pignatel
U. of Trento, Italy
Thermo-mechanical analysis of microstructures for chemoresistive gas sensors
11:00 S. Leseduarte1, S. Marco1, E. Beyne2, R. van Hoof2, A. Marty3, S. Pinel3, O. Vendier4, A. Coello-Vero4
1U. of Barcelona, Spain
2IMEC, Leuven, Belgium
3LAAS, Toulouse, France
4Alcatel Space Industries, Toulouse, France
Residual thermo-mechanical stresses in thinned chip assemblies
11:20 S. Van Dooren1, B. Vandevelde1, E. Beyne1, F. Christiaens2, D. Corlatan2
1IMEC, Leuven, Belgium
2Alcatel Bell, Antwerpen, Belgium
Parametric compact models for flip chip assemblies
11:40 L. Gleton1, P. Lybaert1, B. Dessart2, D. Petitjean2, A. Sturbois2
1Fac Polytech. of Mons, Belgium
2Alcatel ETCA, Charleroi, Belgium
Static and dynamic thermal characterization of a 28 J-lead ceramic package-application of the DELPHI methodology
12:00-13:00 Lunch
13:00-14:20 Session 8

Chair: M.N. Sabry, Mansoura U., Egypt

MEMS
13:00 A. Kruusing, S. Leppävuori, A. Uusimäki, H. Moilanen
U. of Oulu, Finland
Piezoelectric drive for agitation and pumping of coolant in ltcc multilayer modules
13:20 U. Dillner, E. Kessler, J. Müller
IPHT, Jena, Germany
High sensitivity micromachined heat flux sensor: the problem of heat flow field distortion
13:40 J.E. Duarte1,2, M. Moreno2, E. Martin-Badosa2
1TU of Colombia, Colombia,
2U. of Barcelona, Spain
Design and characterization of thermally actuated bimetallic membrane
14:00 E. Burian1, T. Lalinsky1, M. Drzik2
1Inst. of EE, Bratislava, Slovakia
2Inst. of Constr. & Archit., Bratislava, Slovakia
Simulation of thermally exited GaAs micromachined microactuator
14:20-14:40 Coffee
14:40-15:40 Session 9

Chair: J. Parry, Flomerics, Hampton Court, United Kingdom

THERMAL ANALYSIS TECHNIQUES
14:40 V.Székely1, A. Pàhi1, A. Poppe1, M. Rosental1, T. Teszéri1, M. Rencz2
1TU of Budapest, Hungary
2MicRed, Budapest, Hungary
Thermal time constant analysis and implementation in the THERMAN and SUNRED thermal simulation tools
15:00 M. Bologna, E. Dallago, G. Venchi
U. of Pavia, Italy
Thermal analysis of a portable PC
15:20 S. Koziel, W. Szczesniak
TU of Gdansk, Poland
Application of evolutionary algorithms to VLSI circuits partitioning with reduction of thermal interactions between elements
15:40 Closing remarks

 

Tutorials
A- Design and Analysis of Cost-Effective Heat Sinks

Avram Bar-Cohen

Executive Director and Professor
J.J. Renier Chair
Center for the Development of Technological Leadership
University of Minnesota, USA

Contents

The objectives of the tutorials is to acquaint attendees with the modeling approaches, analytical techniques, and experimental correlations needed to design and optimize air-cooled heat sinks for the cost-effective thermal management of electronic components. Attention will be focused on the development of the governing equations for individual fins and arrays of fins, including attention to minimization of fin material, pressure drop in channels (between the fins), and optimum spacings between fins. These relations will be used to define opportunities for heat sink optimization, including maximum thermal performance, least-material designs, and the performance envelope for specified flow rates and pressure drops. Supporting experimental results for natural and forced convection, high performance heat sinks will be presented. The tutorial will also address the constraints imposed by current manufacturing practices on heat sink performance.

Topics to be covered

  • Use of Heat Sinks for Thermal Management of Microelectronics.
  • Thermal Analysis and Design Individual Convective Fins.
  • Least Material Optimization of Individual Convective Fins.
  • Thermal Analysis, Design and Optimization of Natural Convection Heat Sinks.
  • Pressure Drop in Parallel Plate Channels.
  • Thermal Analysis, Design and Optimization of Forced Convection Heat Sinks.
  • Heat Sink Design for Manufacturability.

Instructor

Avram Bar-Cohen is Professor of Mechanical Engineering at the University of Minnesota and Executive Director of the Center for the Development of Technological Leadership. His career in industry and academia has focused on the thermal design, analysis, and optimization of electronic equipment. He is the Editor-in-Chief of the IEEE Transactions on Components and Packaging Technologies and co-author of "Design and Analysis of Heat Sinks" (1995) and "Thermal Analysis and Control of Electronic Equipment" (1983).

B- Thermal Design of Electronic Systems Through Combined Modeling and Testing

Yogendra Joshi

Department of Mechanical Engineering and CALCE Electronic Products and Systems Center
University of Maryland, USA

Contents

Product development cycle times for many electronics systems have shrunk from a few years to a few months. There is an ever-increasing emphasis on smaller, lighter, low cost and high reliability designs. Computer-aided design tools, in conjunction with limited validation testing are rapidly replacing the older build-and-test approach to design. Rapid recent progress in computational heat transfer and fluid flow is beginning to make system level thermal simulations feasible. However, the capabilities and limitations of these tools are often not available to the designer in sufficient detail. This tutorial will provide an introduction to the use of computational fluid dynamics and heat transfer techniques in the design of electronic products. The role of combined modeling and experimentation will be emphasized. An introduction to the role of thermal analysis in reliability and performance assessment will be included. This course should be of interest to industry engineers involved in design of electronic systems, as well as to students and researchers concerned with thermal management and characterization.

Topics to be covered

  • Introduction to semiconductor packaging trends from industry roadmaps and impact on thermal issues.
  • Heat transfer modes and rate equations, with emphasis on thermal characterization of electronics.
  • Rapid thermal characterization with simplified modeling schemes, e.g. resistance networks, and analytical solutions.
  • Current capabilities and limitations of system level CFD simulation methodology.
  • Overview of experimental thermal characterization methods (local temperatures using diodes, thermocouples; full field themal mapping using infra-red and liquid crystals; fluid velocities using hot wires and particle imaging; flow visualization; pressure drop; thermal difusivity). Uncertainty estimation.
  • Combining thermal modeling and measurements for faster time to market.
  • Influence of temperature on product reliability (life) and performance.

Instructor

Yogendra Joshi is Professor of Mechanical Engineering at the University of Maryland at College Park, where he is active in research and instruction in the area of thermal engineering. His prior experience also includes seven years on the faculty at the Naval Postgraduate School (NPS), Monterey, California, and one year in the semiconductor assembly industry. Dr. Joshi received a Doctor of Philosophy in Mechanical Engineering and Applied Mechanics, from the University of Pennsylvania, in 1984. He is currently serving as Associate Technical Editor of the ASME Journal of Electronic Packaging. Prof. Joshi’s research projects deal with heat transfer and fluid flow processes associated with emerging technologies. He has served as an academic advisor to twenty five graduate students. Dr. Joshi is the author or co-author of forty journal articles and numerous conference papers.

 

Proceedings, special issues of journals
The informal proceedings of the workshop is formed by the Collection of papers presented at the 5th Therminic Workshop (368 pages), which was distributed among the workshop participants. Limited number of copies is available for FF200 from TIMA. As follow up to the Workshop special issue of the Microelectronics Journal and a special issue of the IEEE Transactions on Components, Packaging and Manufacturing Technology are being organised based on contributions presented at the 5th Workshop and other original papers. These issues will form the formal proceedings of the workshop.

 

 

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