G.C. MONTANARI, G. MAZZANTI, M. CACCIARI, J.C. FOTHERGILL, "In search of convenient techniques for reducing bias in the estimation of Weibull parameters for uncensored tests", IEEE Transactions on Dielectrics and Electrical Insulation, June 1997, Vol. 4,
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Article : [PAP290]

Titre : G.C. MONTANARI, G. MAZZANTI, M. CACCIARI, J.C. FOTHERGILL, In search of convenient techniques for reducing bias in the estimation of Weibull parameters for uncensored tests, IEEE Transactions on Dielectrics and Electrical Insulation, June 1997, Vol. 4, Issue 3, pp. 306-313.

Cité dans :[PAP285]
Auteur : Montanari, G.C.
Auteur : Mazzanti, G.
Auteur : Cacciari, M.
Auteur : Fothergill, J.C - Dept. of Electr. Eng., Bologna Univ., Italy

Stockage : Thierry LEQUEU
Lien : private/MONTANARI1.pdf - 8 pages, 597 Ko.
Lien : PAP285.HTM#Bibliographie - référence [4].
Source : Dielectrics and Electrical Insulation, IEEE Transactions on [see also Electrical Insulation, IEEE Transactions on]
Pages : 306 - 313
Date : June 1997
Volume : 4
Issue : 3
ISSN : 1070-9878
References : 20
CODEN : ITDIES
Accession_Number : 5680391

Abstract :
Techniques for estimating the parameters of the 2-parameter
Weibull distribution from data obtained from uncensored tests are
compared. This will allow the most convenient method to be chosen
by considering the data's characteristics and the level of
algorithm complexity. It is shown that common techniques, such as
least squares regression and maximum likelihood, may give rise to
very significant errors in terms of the bias of the estimated
Weibull parameters. The estimator suggested by Jacquelin (1993)
for /spl alpha/ and the correction factor suggested by Ross
(1994) for /spl beta/ usually give errors of >5 and >1%,
respectively and are to be recommended, because they are
straightforward to implement. Techniques are available which will
eliminate virtually all bias in the estimation of the parameters,
but these may be at the expense of considerable complexity in
implementation.

Subject_terms :
Weibull distribution; bias reduction; Weibull parameters
estimation; uncensored tests; 2-parameter Weibull distribution;
algorithm complexity; insulation life; time to breakdown


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