Proceedings of the 1999 International Symposium for Testing and Failure Analysis, held 14-18 November 1999 in Santa Clara, California

Contains practical information on failure analysis of microelectronic devices that is immediately applicable to today's problems.

DESCRIPTION: Proceedings of the 25th anniversary symposium on testing and failure analysis of microelectronic devices. The papers included discuss new aspects of the procedures used to assure the quality of these devices that form the heart of modern control and communication equipment. Also covered is the progress made in this field over the past 25 years.

MARKET/AUDIENCE: Persons involved in quality control and failure and analysis of microelectronic devices.

CONTENTS:

• Microelectronic Devices
• Basics of Failure Analysis
• Advanced Techniques
• FA-Laboratory Management
• FIB x Case Histories
• EOS/ESD
• FA of Discrete Components
• Testing
• Backside Analysis

NOTE: The CD-ROM's PDF-file format can be accessed using Adobe Acrobat Reader 4.0 or higher
Published: 1999
Pages: 486
Format: Book and CD ROM