TUTORIAL TRACK: Reliability Fundamentals
Sunday, April 7

Room: Landmark A

111.  Intro Reliability—Tim Rost & Vijay Reddy, TI (8:00 – 11:30)
112.  Gate Oxide Reliability—Eric Vogel, NIST (1:30 – 3:00)
113.  ESD—Charvaka Duvvury, TI (3:30 – 5:00)


Room: Landmark B

121.  Radiation Induced Soft Errors in Silicon Components & 
      Computer Systems—Jose Maiz, Intel, Bob Baumann, TI et al.(8:00 – 5:00)


Room: Landmark C

131.  Errors and Reliability—Kristof Croes, Xpeqt AG and Luc Tielemanns (8:00 – 9:30)
132.  Trends in Failure Analysis—Larry Wagner, Texas Instruments (10:00 – 11:30)
133.  New Phenomena in the Device Reliability Physics of 
      Advanced Submicron CMOS Technologies (NBTI) —
      Giuseppe La Rosa, IBM (1:30 – 5:00)


Room: Landmark D

141.  The basics of Electromigration with a view towards 
      Cu dual-damascene reliability—Ennis Ogawa, TI (8:00 – 9:30)
142.  Introduction to Predictive WLR—Eric Snyder, Sandia Technologies (10:00 – 11:30)
143.  Defect Reliability Statistics with Redundancy—Glenn Shirley, Intel (1:30 – 3:00)