Advanced Tutorials
Monday, April 8

TUTORIAL TRACK: Topics in advanced Reliability 

Room: Landmark A

211.  Reliability Issues for Advanced Silicon Technologies—Tony Oates, Agere  (8:00 – 11:30)
212.  Cu—Based Interconnect Structures—John Sanchez, TI  (1:30 – 3:00)
213.  ESD  Protection and Failure mechanisms in RF Technology—Steven Voldman, IBM  (1:30 – 3:00)

Room: Landmark B


221.  Gate Oxide Reliability—Paul Nicolian, TI  (8:00 – 9:30)
222.  Ant. Charging (PID)—Srikanth Krishnan & Anand Krishnan, TI  (10:00 – 11:30)
223.  Atomic Scale Defects—Pat Lenahan, Penn State  (1:30 – 3:00)
224.  Trap Generation Phenomena—Gennadi Bersuker, SEMATECH  (3:30 – 5:00)

Room: Landmark C


231.  MicroRaman—Ingrid DeWolf, IMEC  (8:00 – 9:30)
232.  Next Generation Imaging—Gay Samuelson, Intel  (10:00 – 11:30)
233.  MOEMS Reliability—Susanne Arney et al., Lucent  (1:30 – 5:00)

Room: Landmark D


241.  Analog/MS—Jae-Sung Rieh & Fernando Guarin, IBM  (8:00 – 9:30)
242.  FRAM—Domokos Hadnagy, Ramtron  (10:00 – 11:30)
243.  GaAs MMIC Reliability—Ken Decker, Triquint Semiconductor  (1:30 – 3:00)
244.  HBT—Tim Henderson, Triquint Semiconductor  (3:30 – 5:00)