ESREF 2003, the 14th European Symposium on Reliability of Electron Devices will take place at Bordeaux (France) from 6th to 10th October 2003.
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for microelectronics. It provides a European forum for developing all aspects of reliability management and advanced analysis techniques for present and future semiconductor applications.
The scope of the EOBT, Electron and Optical Beam Test Conference is included in the ESREF Conference.
This event is organised by the IXL Laboratory (UMR CNRS, ENSEIRB, University Bordeaux 1) and ADERA with the technical co-sponsorship of IEEE - Electron Devices Society and ANADEF association (French association of industrial labs working in failure analysis, web site : http://www.anadef.org/) .
LOCATION OF THE CONFERENCE :
PALATIUM-ARCACHON (50 km from Bordeaux-Airport)
Phone : 33 (0)5 56 22 47 00 - Fax : 33 (0)5 56 22 55 55
The deadline for the submission of three page-extended summaries (including figures) is March 31st, 2003. The title page must include a five-line abstract, the complete address, the fax number and e-mail address of the corresponding author and the preference for oral or poster presentation. Please note that abstracts and papers must be in English.
Authors are requested to send an electronic file (in Adobe Acrobat PDF format) of the summary to the Technical Programme chair at :
31 March 2003 Submission of summary
28 May 2003 Notification of paper acceptance
27 June 2003 Submission of final manuscript
The ESREF 2003 proceedings will be published as a special issue of the journal Microelectronics Reliability and on CD-ROM by Elsevier Science.
18 July 2003 Receipt of the final paper at Elsevier Science (UK)
For further information concerning the Scientific Program, please contact :
Nathalie LABAT - Frédéric VERDIER
Université Bordeaux 1 - Laboratoire IXL
351 cours de la Libération - 33405 TALENCE CEDEX - FRANCE
Phone : 33 (0)5 56 84 65 45 - Fax : 33 (0)5 56 37 15 45
e-mail : email@example.com
The Symposium will feature the latest in service providers, equipment manufacturers and suppliers.
A large exhibit floor will give the opportunity to key-vendors to represent the core business area in these fields.
For further information concerning the equipment exhibition, please contact :
A. BELLIER - ADERA (France) - mailto:firstname.lastname@example.org
Centre Condorcet, 162 avenue Albert Schweitzer - F-33608 PESSAC CEDEX
The conference will concentrate on two main areas of interest in electronics concerning designers, manufacturers and users:
- Strategy for Quality and Reliability Assessment during Product Development and Life Cycle
- Advanced Analysis Techniques for Technologies and Product Evaluation
Tutorials by experts will provide reviews and updates of selected topics of actual interest. Invited papers will introduce the main stream topics.
The Technical Programme Committee is inviting submission of papers that address one or more of the following topics:
Conference Chairman :
A. TOUBOUL - IXL, University of Bordeaux (France)
Technical Program Chair :
N. LABAT - IXL, University of Bordeaux (France)
J.-C. CLEMENT - ANADEF – Thales R&T
Conference Scientific Support :
J.L. AUCOUTURIER - IXL, University of Bordeaux (France)
Y. DANTO - IXL, University of Bordeaux (France)
Scientific Secretariat :
F. VERDIER - IXL, University of Bordeaux (France)
Industrial Exhibition :
A. BELLIER - ADERA (France)
Organisation Secretariat :
I. VOIRIN (email@example.com)
ADERA (Association pour le Développement de l'Enseignement et des Recherches auprès des Universités, des Centres de recherche et des Entreprises d'Aquitaine)