COMMITTEES AND SUB-COMMITTEES
Steering Committee Program
Committee Technical
Subcommittees
L.J. BALK - University of Wuppertal (Germany)
J. BISSCHOP - Philips Semiconductors
(The Netherlands)
Y. DANTO -
IXL, ENSEIRB, University of Bordeaux (France)
F. FANTINI -
University of Modena (Italy)
J.P. FORTEA - CNES (France)
W. GERLING -
Infineon Technologies (Germany)
C. LINDSAY -
Marconi (Great Britain)
L. LONZI - ST Microelectronics
(Italy)
H. MAES -
IMEC (Belgium)
J. MOELTOFT - Oersted.DTU, Technical
University of Denmark (DK)
A.J. MOUTHAAN -
University of Twente (The Netherlands)
C. OLSSON - Ericsson Radio System
(Sweden)
W. WONDRAK - DaimlerChrysler
(Germany)
Conference Chairman :
A. TOUBOUL - IXL, ENSEIRB, University of Bordeaux (France)
Technical Program Chair :
N. LABAT -
IXL, ENSEIRB, University of Bordeaux (France)
Conference Scientific Support
:
J.L. AUCOUTURIER - IXL, ENSEIRB,
University of Bordeaux (France)
Y. DANTO - IXL,
ENSEIRB, University of Bordeaux (France)
Scientific Secretariat :
F. VERDIER -
IXL, ENSEIRB, University of Bordeaux (France)
Industrial Exhibition :
A. BELLIER -
ADERA (France)
Best Paper Award Chairs :
S. RENAUD-LEMASSON - IXL, ENSEIRB, University
of Bordeaux (F)
N. STOJADINOVIC -
University of Nis (Yougoslavia)
Journal Edition Chairs
N. LABAT - IXL, ENSEIRB, University of Bordeaux
(France)
A. TOUBOUL - IXL, ENSEIRB, University of
Bordeaux (France)
Organisation Secretariat :
E. DRILLON, Laboratoire
IXL
UMR 5818/CNRS - ENSEIRB
- Université Bordeaux 1
351, Cours de la Libération, F-33405 TALENCE CEDEX
M. ROUZAIROL - I. VOIRIN
ADERA Service (Association pour le Développement de l'Enseignement et des Recherches auprès des Universités, des Centres de recherche et des Entreprises d'Aquitaine)
Centre Condorcet - B.P. 196 - 162
avenue Albert Schweitzer - F-33608 PESSAC CEDEX
TECHNICAL SUBCOMMITTEES
A - Quality and
Reliability Implementation
Chairmen :
G. DELEUZE (Thales
– F) gilles.deleuze@edf.fr
J.M. MOELTOFT (IAE/Technical University - DK) jmo@oersted.dtu.dk
B1 - Failure Mechanisms
in Silicon Devices
Chairmen :
J. Van der POL
(Philips Semiconductor – NL) Jacob.vanderPol@nym.sc.philips.com
G. GHIBAUDO (LPCS/ENSERG – F) ghibaudo@enserg.fr
B2 – Detection and
Modeling of Failure Mechanisms
Chairman :
N. STOJADINOVIC (University
of Nis - YU) stojadinovic@efnis.elfak.ni.ac.yu
C : Electron and
Optical Beam Testing (EOBT)
Chairmen :
R. CRAMER (Altis
Semiconductor - F) Ronald.Cramer@altissemiconductor.com
W. CLAEYS (University of Bordeaux - F) wclaeys@frbdx11.cribx1.u-bordeaux.fr
D : Advanced
Failure Analysis : case studies
Chairmen :
M. VANZI
(University of Cagliari - I) vanzi@diee.unica.it
Ph. PERDU (CNES - F) Philippe.Perdu@cnes.fr
E : Compound
Semiconductors
Chairmen :
J.M. DUMAS (ENSIL,
University of Limoges - F) dumas@ensil.unilim.fr
H. HARTNAGEL (TU Darmstadt - D) hartnagel@hrz2.hrz.tu-darmstadt.de
F : Packaging,
Assemblies and Microsystems
Chairmen :
Y. DANTO (Univ.
Bordeaux - F) danto@ixl.u-bordeaux.fr
J. BISSCHOP (Philips Semiconductors - NL) jaap.Bisschop@philips.com
G : Power Devices
Chairmen :
W. WONDRAK
(Daimler Chrysler - G) wolfgang.wondrak@daimlerchrysler.com
M. CIAPPA (ETH Zürich – CH) ciappa@iis.ee.ethz.ch
