L. LANTZ, S. HWANG, M. PECHT, "Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing", Microelectronics Reliability, Volume 42, Issues 7, pp. 1163-1170.
Copyright - [Précédente] [Première page] [Suivante] - Home

Article : [ART295]

Titre : L. LANTZ, S. HWANG, M. PECHT, Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing, Microelectronics Reliability, Volume 42, Issues 7, pp. 1163-1170.

Cité dans :[REVUE355] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 8, Pages 1153-1248, August 2002.
Auteur : Leon Lantz
Auteur : Seongdeok Hwang
Auteur : Michael Pecht

Vers : Bibliographie
Adresse : CALCE Electronic Products and Systems Center, University of Maryland, College Park, MD 20742, USA
Tel. : +1-301-935-6469
Fax. : +1-301-935-6723
Lien : mailto:llantz@lps.umd.edu
Source : Microelectronics Reliability
Volume : 42
Issue : 7
Date :
Pages : 1163 - 1170
DOI : 10.1016/S0026-2714(02)00091-4
PII : S0026-2714(02)00091-4
Lien : private/LANTZ1.pdf - 144 Ko, 8 pages.
Switches :
Puissance :
Logiciel :
Stockage :

Abstract :
This paper discusses the assessment of chemical and physical properties of nine
encapsulant materials and the tests which may be used to characterize the
encapsulants and to confirm that the encapsulants are of consistent quality. The
tests include glass transition temperature, coefficient of thermal expansion,
filler content, moisture absorption, and ionic content.

Article Outline
1. Introduction
2. Encapsulant materials
3. PEM material properties
3.1. Glass transition temperature (Tg)
3.2. Coefficient of thermal expansion
3.3. Filler content
3.4. Moisture uptake
3.5. Ionic content
4. Measurements
4.1. Tg and coefficient of thermal expansion
4.2. Filler content
4.3. Ion content
5. Results
5.1. Glass transition temperature (Tg)
5.2. Coefficient of thermal expansion
5.3. Filler content
5.4. Moisture absorption
5.5. Ion content
6. Conclusions
Acknowledgements

[Fig] : 1. Typical TMA plot of molding compound.
[Fig] : 2. Typical TGA plot of molding compound.
Table 1. Chemical composition of molding compounds (<1K)
Table 2. Typical molding compound procurement specification (<1K)
Table 3. CTE for some typical PEM materials (<1K)
Table 4. Glass transition temperature of molding compounds (sample size of 12) (<1K)
Table 5. CTE of molding compounds below Tg (sample size of 12) (<1K)
Table 6. CTE of molding compounds above Tg (sample size of 12) (<1K)
Table 7. Filler content of molding compounds (sample size of 10) (<1K)
Table 8. Moisture absorption of molding compounds (sample size of 5) (<1K)
Table 9. Ionic content of molding compounds (6K)


Bibliographie

TOP

Références : 20
[1] : M.G. Pecht, L.T. Nguyen and E.B. Hakim , Plastic encapsulated microelectronics. , John Wiley & Sons, New York (1994).
[2] : M.G. Pecht, A. Dasgupta and J. Evans , Quality conformance and qualification of microelectronic packages and interconnects. , John Wiley & Sons, New York (1994).
[3] : L.T. Manzione , Plastic packaging of microelectronic devices. , Van Nostrand Reinhold, New York (1990).
[4] : N. Kinjo, M. Ogata, K. Nish and A. Kaneda , Epoxy molding compounds as encapsulation materials for microelectronic devices. In: Advanced polymer science 88, Springer-Verlag, Berlin (1989).
[5] : N. Hanssen , Powdered epoxy resin test methods. Proc. IEEE/CHMT IEMT Symp. (1998), pp. 106¯108.
[6] : M.T. Goosey , Plastics for microelectronics. , Elsevier Applied Science Publishers, New York (1985).
[7] : Rauhut HW. Advances in epoxy molding compounds. Regional Technical Conference¯¯Society of Plastics Engineers, 1998. p. 68¯80.
[8] : E.W. Flick , Epoxy resins, curing agents, compounds, and modifiers: an industrial guide. , Noyes Publications, Park Ridge (1993).
[9] : Wright R. Role of fillers/reinforcements in thermosetting molding compounds. Regional Technical Conference¯¯Society of Plastics Engineers, 1992. p. 83¯92.
[10] : M.M. Khan and H. Fatemi , Gold¯aluminum bond failure induced by halogenated additives in epoxy molding compounds. Proc. IEEE Int. Reliab. Phys. Symp. (1986), pp. 420¯428. Abstract-INSPEC
[11] : L.T. Nguyen, R.H.Y. Lo, A.S. Chen and J.G. Belani , Molding compound trends in a denser packaging world: qualification tests and reliability concerns. IEEE Trans. Reliab. 42 4 (1993), pp. 518¯535. Abstract-INSPEC
[12] : P. McCluskey, R. Munamarty and M.G. Pecht , Popcorning in PBGA packages during IR reflow soldering. Microelectron. Int. (1997), pp. 20¯23. Abstract-INSPEC
[13] : A. Hale, M. Garcia, C.W. Macosko and L.T. Manzione , Spiral flow modelling of a filled epoxy-novolac molding compound. Proc. SPE ANTEC (1989), pp. 796¯799. Abstract-Compendex
[14] : L.T. Nguyen, S.A. Gee, M.R. Johnson, H.E. Grimm, H. Berardi and R.L. Walberg , Effects of die coatings, mold compounds, and test conditions on temperature cycling failures. IEEE Trans. Compon. Pack. Manuf. Technol.¯¯Part A 18 1 (1995), pp. 15¯22. Abstract-Compendex | Abstract-INSPEC | Full Text via CrossRef
[15] : E.A. Sullivan , Thermal degradation of epoxy novolac-phenol formaldehyde novolac resin systems. J. Appl. Polym. Sci. 42 7 (1991), pp. 1815¯1828.
[16] : D.J. Belton, E.A. Sullivan and M.J. Molter , Moisture transport phenomena in epoxies for microelectronics applications. In: Polymeric materials for electronics packaging and interconnection, American Chemical Society, Washington, DC (1989), pp. 286¯320.
[17] : G. Margaritis and F.J. McGarry , A method to predict cracking in IC plastic packages. IEEE Trans. Compon. Pack. Manuf. Technol.¯¯Part B 17 2 (1994), pp. 209¯216. Abstract-Compendex | Abstract-INSPEC | Full Text via CrossRef
[18] : A.A. Gallo , Effect of mold compound components on moisture-induced degradation of gold¯aluminum bonds in epoxy encapsulated devices. Proc. IEEE Int. Reliab. Phys. Symp. 4 (1990), pp. 244¯251. Abstract-INSPEC | Abstract-Compendex
[19] : J.M. Soden and R.E. Anderson , IC failure analysis: techniques and tools for quality and reliability improvement. Microelectron. Reliab. 35 3 (1995), pp. 429¯452. Abstract-INSPEC
[20] : T.W. Lee and S.V. Pabbisetty , Microelectronic failure analysis. , ASM International, Materials Park (1993).


Mise à jour le lundi 10 avril 2023 à 18 h 46 - E-mail : thierry.lequeu@gmail.com
Cette page a été produite par le programme TXT2HTM.EXE, version 10.7.3 du 27 décembre 2018.

Copyright 2023 : TOP

Les informations contenues dans cette page sont à usage strict de Thierry LEQUEU et ne doivent être utilisées ou copiées par un tiers.
Powered by www.google.fr, www.e-kart.fr, l'atelier d'Aurélie - Coiffure mixte et barbier, La Boutique Kit Elec Shop and www.lequeu.fr.